Analysis and measurement of the external modulation of modelocked laser diodes (relative noise performance)

Benson C. Lam; Albert L. Kellner; David C. Campion; Joannes M. Costa; Paul K. L. Yu

doi:10.1117/12.24879

1 February 1991 Analysis and measurement of the external modulation of modelocked laser diodes (relative noise performance)

Benson C. Lam, Albert L. Kellner, David C. Campion, Joannes M. Costa, Paul K. L. Yu

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Proceedings Volume 1371, High-Frequency Analog Fiber Optic Systems; (1991) https://doi.org/10.1117/12.24879
Event: SPIE Microelectronic Interconnect and Integrated Processing Symposium, 1990, San Jose, United States

Abstract

The measurement of the relative intensity noise (RIN) of a ridge waveguide laser and a distributed feedback laser under CW, external cavity, direct modulation, and modelocking conditions is presented. The purpose is to determine the relative noise performance of modelocked laser diodes. The results indicate that the RIN of modelocked lasers are comparable to CW lasers but lower than both external cavity lasers (optimized for modelocking but without the applied RF) and directly modulated lasers; the difference can be as much as 5 optical dB. The microwave carriers produced optically by the direct modulation and modelocking of laser diodes are also compared. The comparison determines that modelocked lasers produce less noisy and more RF power efficient microwave carriers. However, no difference in microwave linewidth is detected within the limit of the resolution bandwidth of the detection system.

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Benson C. Lam, Albert L. Kellner, David C. Campion, Joannes M. Costa, and Paul K. L. Yu "Analysis and measurement of the external modulation of modelocked laser diodes (relative noise performance)", Proc. SPIE 1371, High-Frequency Analog Fiber Optic Systems, (1 February 1991); https://doi.org/10.1117/12.24879

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KEYWORDS

Modulation

Semiconductor lasers

Microwave radiation

Mode locking

Continuous wave operation

Performance modeling

Waveguide lasers

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