A triangulation based profiler

T. A. Clarke

doi:10.1117/12.2294364

1 August 1990 A triangulation based profiler

T. A. Clarke

Proceedings Volume 1395, Close-Range Photogrammetry Meets Machine Vision; 13953D (1990) https://doi.org/10.1117/12.2294364
Event: Close-Range Photogrammetry Meets Machine Vision, 1990, Zurich, Switzerland

Abstract

This paper reports a triangulation based measuring system which has applicability to the increasing demand for close range measurement data. This system uses a linear sensor array and diode laser light source and is discussed with respect to theory, calibration and practical results. An analysis of the use of this profiler to acquire spatial information (e.g. wriggle surveys, refurbishment) and local information (e.g. deformation) is given. Consideration is given to: errors from setting up, establishing a datum, profile position, and the inherent errors particular to triangulation systems.

Citation Download Citation

T. A. Clarke "A triangulation based profiler", Proc. SPIE 1395, Close-Range Photogrammetry Meets Machine Vision, 13953D (1 August 1990); https://doi.org/10.1117/12.2294364

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