Scattering parameter measurements using a three-probe microstrip circuit

Ming-Yi Li

doi:10.1117/12.2301646

1 December 1990 Scattering parameter measurements using a three-probe microstrip circuit

Ming-Yi Li

Proceedings Volume 1514, 15th International Conference on Infrared and Millimeter Waves; 15146K (1990) https://doi.org/10.1117/12.2301646
Event: 15th International Conference on Infrared and Millimeter Waves, 1990, Orlando, FL, United States

Abstract

A simple, low cost three - probe microstrip circuit has been developed for S - parameter measurements of a two - port network. The results agree very well with those from HP 8510 automatic network analyzer. The design and algorithm can be easily scaled to millimeterwave frequencies.

Citation Download Citation

Ming-Yi Li "Scattering parameter measurements using a three-probe microstrip circuit", Proc. SPIE 1514, 15th International Conference on Infrared and Millimeter Waves, 15146K (1 December 1990); https://doi.org/10.1117/12.2301646

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