Feasibility study of the use of synchrotron radiation in the calibration of AXAF: initial reflectivity results

Dale E. Graessle; Roger J. V. Brissenden; J. C. Cobuzzi; John P. Hughes; Edwin M. Kellogg; Fred E. Mootz; Daniel A. Schwartz; Patrick O. Slane; Martin V. Zombeck; Richard L. Blake; Jeffrey C. Davis

doi:10.1117/12.51222

1 January 1992 Feasibility study of the use of synchrotron radiation in the calibration of AXAF: initial reflectivity results

Dale E. Graessle, Roger J. V. Brissenden, J. C. Cobuzzi, John P. Hughes, Edwin M. Kellogg, Fred E. Mootz, Daniel A. Schwartz, Patrick O. Slane, Martin V. Zombeck, Richard L. Blake, Jeffrey C. Davis

Author Affiliations +

Proceedings Volume 1546, Multilayer and Grazing Incidence X-Ray/EUV Optics; (1992) https://doi.org/10.1117/12.51222
Event: San Diego, '91, 1991, San Diego, CA, United States

Abstract

The 1-percent calibration accuracy goal of the Advanced X-ray Astrophysics Facility is being approached by way of an experiment at the National Synchrotron Light Source that will demonstrate the accuracy achievable in reflectance measurements conducted on coated flat mirrors in the 50 eV-12 keV energy range. The coatings will be of commercially produced Au, Ni, and Ir, deposited either by sputtering or by e-beam deposition. Optical constants will be estimated via the reflectance vs. angle-of-incidence method.

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Dale E. Graessle, Roger J. V. Brissenden, J. C. Cobuzzi, John P. Hughes, Edwin M. Kellogg, Fred E. Mootz, Daniel A. Schwartz, Patrick O. Slane, Martin V. Zombeck, Richard L. Blake, and Jeffrey C. Davis "Feasibility study of the use of synchrotron radiation in the calibration of AXAF: initial reflectivity results", Proc. SPIE 1546, Multilayer and Grazing Incidence X-Ray/EUV Optics, (1 January 1992); https://doi.org/10.1117/12.51222

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