Complete measurement of Kerr parameters by using rotating-analyzer magneto-optic spectroscopy

Liang-Yao Chen; Xing-Wei Feng; Yushi Tian; Yi Su; Hong-Zhou Ma; You-Hua Qian; Defang Shen; John A. Woollam

doi:10.1117/12.138800

11 December 1992 Complete measurement of Kerr parameters by using rotating-analyzer magneto-optic spectroscopy

Liang-Yao Chen, Xing-Wei Feng, Yushi Tian, Yi Su, Hong-Zhou Ma, You-Hua Qian, Defang Shen, John A. Woollam

Author Affiliations +

Proceedings Volume 1746, Polarization Analysis and Measurement; (1992) https://doi.org/10.1117/12.138800
Event: San Diego '92, 1992, San Diego, CA, United States

Abstract

An improved type of scanning and analyzer rotating magneto-optic spectroscopy has been designed and constructed. By adding an achromatic quart-wavelength retarder to the system and using Fourier transformation, the complete magneto-optic parameters, both polar Kerr rotation angle 6kand ellipticity k' have been measured in the 1.5-5-eV photon energy range and at a near normal incident angle of less than 2 degrees. A fine step motor with 1000 steps per revolution and a hollow shaft, on which the analyzer is directly mounted, is used to control precisely the analyzer azimuthal angle. The magnetic field, spectral scanning, and retarder position, as well as data processing are totally controlled by a microcomputer. The magneto-optic spectral results of the system is illustrated for FeTeCo film samples.

Citation Download Citation

Liang-Yao Chen, Xing-Wei Feng, Yushi Tian, Yi Su, Hong-Zhou Ma, You-Hua Qian, Defang Shen, and John A. Woollam "Complete measurement of Kerr parameters by using rotating-analyzer magneto-optic spectroscopy", Proc. SPIE 1746, Polarization Analysis and Measurement, (11 December 1992); https://doi.org/10.1117/12.138800

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