Paper
1 March 1994 Effects of radiation on long wavelength devices and fibers
Alvin S. Kanofsky, Krishna Rao Linga
Author Affiliations +
Proceedings Volume 2074, Fiber Optics Reliability and Testing: Benign and Adverse Environments; (1994) https://doi.org/10.1117/12.168629
Event: Optical Tools for Manufacturing and Advanced Automation, 1993, Boston, MA, United States
Abstract
We have measured the effects of radiation on various long wavelength diode devices using InGaAs technology. The various components were exposed to radiation of continuous electron and gamma beams at the Lehigh University Van de Graaff Radiation Facility and proton beams at the Brookhaven Tandem Facility.
© (1994) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Alvin S. Kanofsky and Krishna Rao Linga "Effects of radiation on long wavelength devices and fibers", Proc. SPIE 2074, Fiber Optics Reliability and Testing: Benign and Adverse Environments, (1 March 1994); https://doi.org/10.1117/12.168629
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KEYWORDS
Radiation effects

Diodes

Electron beams

Collimators

Gamma radiation

Indium gallium arsenide

Infrared spectroscopy

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