PERSONAL Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.
Simple reflection techniques for optical parameter determination of isotropic or anisotropic multilayers on a lower refractive index substrate are presented here. In case of weak absorption in at least one of the layers characteristic minima appear in the angular dependence of the reflectivity by computer fit of which the layer refractive indices and thicknesses can be determined. In case of a monolayer the achieved accuracy is better than the third and fourth decimal in the real and imaginary part of the refraction index, respectively. The fit of bi-layers has lower accuracy, but has the advantage of refractive index determination of non-absorbing layer(s) in the presence of a weakly absorbing auxiliary layer. Comparison between measured refractive indices by reflectometric and optical waveguiding methods shows agreement within 0.001.
PERSONAL Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.
The alert did not successfully save. Please try again later.
Emoeke Loerincz, Robert Klug, "Refractometry of weakly absorbing multilayers via reflectometry," Proc. SPIE 2208, Refractometry, (23 June 1995); https://doi.org/10.1117/12.213186