Paper
28 July 1994 Characterization of microoptical elements by a stand-alone atomic-force microscope
J. Rgen Burger, Nicholas X. Randall, Rainer F. Christoph, Lei Yan, Olivier M. Parriaux
Author Affiliations +
Abstract
The microfabrication of optical and micromechanical elements requires a high degree of accuracy in order to obtain the required efficiency in the functionality of the element. An easy, nondestructive 3D characterization of the batch fabricated elements after each fabrication step is needed to ensure a reliable engineering control over the whole process. We demonstrate the versatility of a stand-alone AFM which can be used as a flexible tool for the nondestructive characterization of all steps of a fabrication sequence of microfabricated optical and micromechanical elements without the necessity to specially prepare the samples under test.
© (1994) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
J. Rgen Burger, Nicholas X. Randall, Rainer F. Christoph, Lei Yan, and Olivier M. Parriaux "Characterization of microoptical elements by a stand-alone atomic-force microscope", Proc. SPIE 2213, Nanofabrication Technologies and Device Integration, (28 July 1994); https://doi.org/10.1117/12.180984
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Diffraction gratings

Optical components

Microfabrication

Fresnel lenses

Atomic force microscopy

Diffraction

Diffractive optical elements

Back to Top