Thermal imaging of subsurface microwave absorbers in dielectric materials

Robert Osiander; Jane W. Maclachlan Spicer; John C. Murphy

doi:10.1117/12.171162

21 March 1994 Thermal imaging of subsurface microwave absorbers in dielectric materials

Robert Osiander, Jane W. Maclachlan Spicer, John C. Murphy

Proceedings Volume 2245, Thermosense XVI: An International Conference on Thermal Sensing and Imaging Diagnostic Applications; (1994) https://doi.org/10.1117/12.171162
Event: SPIE's International Symposium on Optical Engineering and Photonics in Aerospace Sensing, 1994, Orlando, FL, United States

Abstract

The use of microwaves as a heating source in time-resolved IR radiometry provides the ability to heat surface and subsurface microwave-absorbing regions of a specimen directly. This can improve the contrast and spatial resolution of such regions and enhance their detectibility when compared with conventional laser or flashlamp sources. The experiments reported here use microwave heating with IR detection. Results on plexiglass-water-Teflon test specimens with absorbers at different depths in the sample are described by a 1D analytical model. Measurements using microwave and optical heating on epoxy-coated steel pipes are compared and demonstrate the ability of microwave heating to detect subsurface water voids very efficiently. Other applications of the method to microwave imaging, field mapping and imaging of defects in composite materials are discussed.

Citation Download Citation

Robert Osiander, Jane W. Maclachlan Spicer, and John C. Murphy "Thermal imaging of subsurface microwave absorbers in dielectric materials", Proc. SPIE 2245, Thermosense XVI: An International Conference on Thermal Sensing and Imaging Diagnostic Applications, (21 March 1994); https://doi.org/10.1117/12.171162

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