Correlation of 0.67um scatter with local stress in Ge impacted with the modified Cambridge liquid jet device

Michael Wilson; D. Price; Steve Strohecker

doi:10.1117/12.187334

28 September 1994 Correlation of 0.67um scatter with local stress in Ge impacted with the modified Cambridge liquid jet device

Michael Wilson, D. Price, Steve Strohecker

Author Affiliations +

Proceedings Volume 2286, Window and Dome Technologies and Materials IV; (1994) https://doi.org/10.1117/12.187334
Event: SPIE's 1994 International Symposium on Optics, Imaging, and Instrumentation, 1994, San Diego, CA, United States

Abstract

Germanium witness samples were impacted with the NAWCADWAR modified Cambridge liquid jet device introducing varying levels of damage about the center of each sample. Surface damage statistics were collected, scatter measurements were made at 0.67 micrometers and the samples were failed in tension using a bi-axial flexure test setup. The level and character of the damage was correlated with the reflected scatter measurements as a function of local stress and flaw size distribution. Bi-axial flexure data was analyzed to predict fracture stress and the probability of failure of the germanium samples. The mechanical data were then correlated with the scatter data in order to correlate the BRDF with the material failure. The BRDF measurements were taken in several different orientations in order to study the differences in scatter character for the in-plane and out-of-plane conditions.

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Michael Wilson, D. Price, and Steve Strohecker "Correlation of 0.67um scatter with local stress in Ge impacted with the modified Cambridge liquid jet device", Proc. SPIE 2286, Window and Dome Technologies and Materials IV, (28 September 1994); https://doi.org/10.1117/12.187334

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