Paper
8 May 1995 Error analysis of a Shack-Hartmann wavefront sensor
Hiroshi Suzuki, Jiro Suzuki, Tadashi Matsushita, Satoshi Wakabayashi
Author Affiliations +
Abstract
We analyzed the measurement errors of a Shack-Hartmann sensor caused by two major factors. One is caused by the collimation lens aberration change which occurs due to the light path shift in the collimation lens. Another is the defocus of the collimation lens due to ambient temperature change. To obtain the aberration change caused by the light path shift, we apply the primary aberration to the collimation lens aberration at arbitrary light path. To obtain the defocus by ambient temperature change, we derived a formula as a function of the temperature dependence of the refractive indices and the linear expansion coefficients of the lens and the lens mount. Measurement errors of a Shack-Hartmann sensor are estimated by both methods of ray trace and the present error analysis to examine the performance. The results show good agreement with the measurement error of the light path shift and the temperature change. This analysis is effective for analysis of the measurement error of the sensor, which can be utilized for reducing the residual measurement error.
© (1995) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Hiroshi Suzuki, Jiro Suzuki, Tadashi Matsushita, and Satoshi Wakabayashi "Error analysis of a Shack-Hartmann wavefront sensor", Proc. SPIE 2443, Smart Structures and Materials 1995: Smart Structures and Integrated Systems, (8 May 1995); https://doi.org/10.1117/12.208318
Lens.org Logo
CITATIONS
Cited by 2 scholarly publications.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Error analysis

Collimation

Sensors

Wavefront sensors

Temperature metrology

Wavefronts

Ray tracing

Back to Top