Reduction of flight hardware outgassing after integration under a less stringent requirement

David W. Hughes; Glenn P. Rosecrans; Jack J. Triolo; Patricia A. Hansen

doi:10.1117/12.258315

11 November 1996 Reduction of flight hardware outgassing after integration under a less stringent requirement

David W. Hughes, Glenn P. Rosecrans, Jack J. Triolo, Patricia A. Hansen

Author Affiliations +

Proceedings Volume 2864, Optical System Contamination V, and Stray Light and System Optimization; (1996) https://doi.org/10.1117/12.258315
Event: SPIE's 1996 International Symposium on Optical Science, Engineering, and Instrumentation, 1996, Denver, CO, United States

Abstract

In preparation for the Hubble Space Telescope (HST) second servicing mission, hardware which was assembled a decade earlier was refurbished and cleaned to meet a requirement more than an order of magnitude cleaner than the original requirement. The fine guidance sensor (FGS) radial bay module is located in ]close proximity to the HST science instruments; therefore the condemnation sensitivity of the second servicing mission science instruments necessitated the establishment of new FGS contamination requirements. These new requirements are based on a critical optics temperature of minus 88 degrees Celsius; the original FGS outgassing requirements were based on protecting the HST primary mirror, which has an average temperature of plus 10 degrees Celsius. A contamination reduction plan was devised, implemented, and refined, resulting in partial deintegration of the FGS, the use of molecular adsorbers, and the use of a bakeout temperature within 1 degree of Celsius of the maximum survival temperature of the hardware. Final contamination measurements are within 3% of the predicted levels and meet the second servicing mission contamination requirements.

Citation Download Citation

David W. Hughes, Glenn P. Rosecrans, Jack J. Triolo, and Patricia A. Hansen "Reduction of flight hardware outgassing after integration under a less stringent requirement", Proc. SPIE 2864, Optical System Contamination V, and Stray Light and System Optimization, (11 November 1996); https://doi.org/10.1117/12.258315

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