Interferometric displacement measurements performed with a self-mixing microinterferometer

Johannes Roths; Martin Breinbauer; Bernhard Hilber; Christoph Gerz; Igor Koltchanov; Klaus Petermann

doi:10.1117/12.281186

17 September 1997 Interferometric displacement measurements performed with a self-mixing microinterferometer

Johannes Roths, Martin Breinbauer, Bernhard Hilber, Christoph Gerz, Igor Koltchanov, Klaus Petermann

Proceedings Volume 3098, Optical Inspection and Micromeasurements II; (1997) https://doi.org/10.1117/12.281186
Event: Lasers and Optics in Manufacturing III, 1997, Munich, Germany

Abstract

Experimental results of linear displacement measurements performed with a new type of micro-interferometer are presented. This interferometer is base don the self-mixing effect in GaAlAs or InGaAlP diode lasers. The very simple interferometer design offers a number of advantages: it is small, rugged, easy to align and it consists of only a few optical components. With a new-developed two-tone modulation technique and signal processing algorithms, a direction- dependent interference signal can be generated with high signal-to-noise ratio. We present here theoretical and experimental investigations that allow the characterization of the laser operating conditions for a stable self-mixing interference signal. Both visible and near-IR Fabry-Perot diode lasers were tested and found to be suitable for self- mixing interferometry. The nonlinearity in the fringe interpolation was experimentally evaluated for the self- mixing micro-interferometer to be less than 10 nm. Improvements in the stability of the optical setup will further reduce this figure. The stability of the laser wavelength was shown to be in the order of 1 X 10^-6. Intercomparison with other techniques, including glass scales and the 'Laser Stylus' RM600 LS, are discussed.

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Johannes Roths, Martin Breinbauer, Bernhard Hilber, Christoph Gerz, Igor Koltchanov, and Klaus Petermann "Interferometric displacement measurements performed with a self-mixing microinterferometer", Proc. SPIE 3098, Optical Inspection and Micromeasurements II, (17 September 1997); https://doi.org/10.1117/12.281186

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