CONFERENCE PROCEEDINGS
Advanced Search
Home > Proceedings > Volume 3204 > Article
Paper
10 December 1997 Scale artifact length dependence of videogrammetry system uncertainty
Scott C. Sandwith
Author Affiliations +
Proceedings Volume 3204, Three-Dimensional Imaging and Laser-based Systems for Metrology and Inspection III; (1997) https://doi.org/10.1117/12.294464
Event: Intelligent Systems and Advanced Manufacturing, 1997, Pittsburgh, PA, United States
Abstract
Testing has shown significant dependence between the length of the scale artifact and the achievable system uncertainty for high accuracy industrial videogrammetry on high aspect ratio objects. Shop practice traditionally allows scale artifacts under 1/5 the object length. This practice can lead to higher than expected uncertainties because the uncertainty of the metric defining the physical scale must be multiplied by the ratio of object length to scale artifact length. This relationship is incorporated into the U95 uncertainty relationship. Test cases validating the uncertainty model are also presented. A network of scale reference points can also be integrated on an object using a laser tracking interferometer. Testing results show a significant reduction in total uncertainties when using this network to define the scale for videogrammetry applications. Measuring a 500-inch (12.7 meters) object and scaling the survey with a 130-inch (3.3 meters), scale bar produced an uncertainty of 22-ppm. When the 500-inch object survey was scaled with laser tracker data, the system yielded an uncertainty of 9-ppm.
© (1997) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Citation Download Citation
Scott C. Sandwith "Scale artifact length dependence of videogrammetry system uncertainty", Proc. SPIE 3204, Three-Dimensional Imaging and Laser-based Systems for Metrology and Inspection III, (10 December 1997); https://doi.org/10.1117/12.294464
ACCESS THE FULL ARTICLE
ORGANIZATIONAL
Sign in with credentials provided by your organization.
INSTITUTIONAL
Select your institution to access the SPIE Digital Library.
SELECT YOUR INSTITUTION
PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.
PERSONAL SIGN IN
No SPIE Account? Create one
;
PURCHASE THIS CONTENT
SUBSCRIBE TO DIGITAL LIBRARY
50 downloads per 1-year subscription
Members: $195
Non-members: $335 ADD TO CART
25 downloads per 1 - year subscription
Members: $145
Non-members: $250 ADD TO CART
PURCHASE SINGLE ARTICLE
Includes PDF, HTML & Video, when available
Members: $17.00
Non-members: $21.00 ADD TO CART
PROCEEDINGS
 12 PAGES
DOWNLOAD PAPER SAVE TO MY LIBRARY
GET CITATION
Lens.org Logo
CITATIONS
Cited by 10 scholarly publications.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Interferometers
RELATED CONTENT
Subscribe to Digital Library
Receive Erratum Email Alert
Back to Top