Photoluminescent investigations of SHF irradiation effect on defect states in GaAs:Sn(Te) and InP crystals

Irene B. Ermolovich; Evgenie F. Venger; Raisa V. Konakova; Viktor V. Milenin; Sergey V. Svechnikov; Mihail V. Sheveljev

doi:10.1117/12.306225

20 April 1998 Photoluminescent investigations of SHF irradiation effect on defect states in GaAs:Sn(Te) and InP crystals

Irene B. Ermolovich, Evgenie F. Venger, Raisa V. Konakova, Viktor V. Milenin, Sergey V. Svechnikov, Mihail V. Sheveljev

Author Affiliations +

Proceedings Volume 3359, Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics 1997; (1998) https://doi.org/10.1117/12.306225
Event: International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics, 1997, Kiev, Ukraine

Abstract

Results of investigations of magnetron and hyrotron irradiations effects on spectra of local states to be formed by intrinsic and impurity point structure defects in nearsurface layers of GaAs:Sn (111), GaAs:Sn (100), GaAs:Te (111) and InP (100) have been studied and discussed. The effect of SHF irradiation on defect states in GaAs and InP has been obtained to depend on both the type of doped impurity and the orientation of sample surface. The important role of intrinsic vacancies in processes of rebuilding point and complex defects in nearsurface layers has been established. The gettering action of SHF- irradiation on point defects and the increase of homogeneity of SHF-irradiated crystals have been found. The mechanisms of SHF-fields and semiconductor compounds interactions are discussed.

Citation Download Citation

Irene B. Ermolovich, Evgenie F. Venger, Raisa V. Konakova, Viktor V. Milenin, Sergey V. Svechnikov, and Mihail V. Sheveljev "Photoluminescent investigations of SHF irradiation effect on defect states in GaAs:Sn(Te) and InP crystals", Proc. SPIE 3359, Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics 1997, (20 April 1998); https://doi.org/10.1117/12.306225

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available