Infrared refractive indices and thermo-optic coefficients for several materials

William J. Tropf; Michael E. Thomas; Milton J. Linevsky

doi:10.1117/12.326661

8 October 1998 Infrared refractive indices and thermo-optic coefficients for several materials

William J. Tropf, Michael E. Thomas, Milton J. Linevsky

Author Affiliations +

Proceedings Volume 3425, Optical Diagnostic Methods for Inorganic Transmissive Materials; (1998) https://doi.org/10.1117/12.326661
Event: SPIE's International Symposium on Optical Science, Engineering, and Instrumentation, 1998, San Diego, CA, United States

Abstract

Two techniques for deriving refractive index from high- resolution interferometric infrared transmission measurements are presented. The general characteristics of these techniques are described. Artificial data are used to explore the sensitivity of these techniques to various error sources. Refractive index is determined from interferometric measurements of several materials, including diamond, cubic silicon carbide, yttrium oxide, and KRS-5. The described analysis techniques are applied in a complimentary way to develop temperature-dependent Sellmeier type refractive index models that give accurate dispersion and thermo-optic coefficients. For several of these materials our results are the first infrared measurements of temperature-dependent dispersion. Our results are compared to published refractive index and thermo-optic coefficient data when it exists.

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William J. Tropf, Michael E. Thomas, and Milton J. Linevsky "Infrared refractive indices and thermo-optic coefficients for several materials", Proc. SPIE 3425, Optical Diagnostic Methods for Inorganic Transmissive Materials, (8 October 1998); https://doi.org/10.1117/12.326661

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