Noise compensation method study on APD photoelectronic detector

Dianren Chen; Huilin Jiang; Guiying Li

doi:10.1117/12.319620

19 August 1998 Noise compensation method study on APD photoelectronic detector

Dianren Chen, Huilin Jiang, Guiying Li

Proceedings Volume 3547, Semiconductor Lasers III; (1998) https://doi.org/10.1117/12.319620
Event: Photonics China '98, 1998, Beijing, China

Abstract

The noise compensation method of APD photoelectronic sensor C30950E is studied in this paper. The noise theory and the compensation method of the constant false alarm rate are introduced, an APD noise compensation method controlled by a single chip microprocessor AT89C2051 is given.

Citation Download Citation

Dianren Chen, Huilin Jiang, and Guiying Li "Noise compensation method study on APD photoelectronic detector", Proc. SPIE 3547, Semiconductor Lasers III, (19 August 1998); https://doi.org/10.1117/12.319620

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