Visual measurement on BGA chip leaders

Shenghua Ye; Yu Qiu; Changku Sun

doi:10.1117/12.318365

10 August 1998 Visual measurement on BGA chip leaders

Shenghua Ye, Yu Qiu, Changku Sun

Proceedings Volume 3558, Automated Optical Inspection for Industry: Theory, Technology, and Applications II; (1998) https://doi.org/10.1117/12.318365
Event: Photonics China '98, 1998, Beijing, China

Abstract

Sometimes the objects of isolated surfaces, such as BGA chip leaders, need to be dealt with. Here, a method of visual measurement is proposed for on-line measurement. An image split-splicing technology is developed next to the theory of the system is analyzed to develop the test speed while keeping the resolution. Based on the theory, an isolated surface measurement system is formed for gauging the BGA leaders' top coplanarity.

Citation Download Citation

Shenghua Ye, Yu Qiu, and Changku Sun "Visual measurement on BGA chip leaders", Proc. SPIE 3558, Automated Optical Inspection for Industry: Theory, Technology, and Applications II, (10 August 1998); https://doi.org/10.1117/12.318365

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