Phase-step calibration

Hedser H. van Brug

doi:10.1117/12.360151

6 September 1999 Phase-step calibration

Hedser H. van Brug

Proceedings Volume 3739, Optical Fabrication and Testing; (1999) https://doi.org/10.1117/12.360151
Event: Optical Systems Design and Production, 1999, Berlin, Germany

Abstract

An effective method to obtain the phase distribution is to use phase stepped interferometry. By recording a number of interferograms, all having a different phase step between the interfering beams, the phase distribution can be calculated. The accuracy of the phase distribution depends strongly on the accuracy of the applied phase step, i.e. the change in phase difference between the interfering beams. A novel scheme is presented that yields the change in phase difference between two recordings. It is shown that the calculation of the correlation between the two recording can directly be used to obtain the difference in phase stp between the two recordings. The accuracy in the obtained phase step value is better than 0.1 percent for all commonly used phase steps.

Citation Download Citation

Hedser H. van Brug "Phase-step calibration", Proc. SPIE 3739, Optical Fabrication and Testing, (6 September 1999); https://doi.org/10.1117/12.360151

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available