Direct measurement of refractive index profile in liquid crystal planar waveguides

Aleksander Kiezun; Leszek R. Jaroszewicz; Andrzej Walczak; Edward Nowinowski-Kruszelnicki

doi:10.1117/12.357766

17 August 1999 Direct measurement of refractive index profile in liquid crystal planar waveguides

Aleksander Kiezun, Leszek R. Jaroszewicz, Andrzej Walczak, Edward Nowinowski-Kruszelnicki

Proceedings Volume 3745, Interferometry '99: Applications; (1999) https://doi.org/10.1117/12.357766
Event: International Conference on Optical Metrology, 1999, Pultusk Castle, Poland

Abstract

The collected results of the refraction index profile measurement in highly anisotropic, tunable liquid crystalline waveguides are presented. The three different liquid crystal substances have been examined. Initial orientation of the liquid crystal layer is deformed by an external electric field. The initial orientations have been prepared as twisted and planar for liquid crystal material with positive dielectric anisotropy. In the liquid crystal material with negative dielectric anisotropy as initial has been examined hybrid orientation.

Citation Download Citation

Aleksander Kiezun, Leszek R. Jaroszewicz, Andrzej Walczak, and Edward Nowinowski-Kruszelnicki "Direct measurement of refractive index profile in liquid crystal planar waveguides", Proc. SPIE 3745, Interferometry '99: Applications, (17 August 1999); https://doi.org/10.1117/12.357766

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