Accelerated-aging tests of radiation-damaged lasers and photodiodes for the CMS tracker optical links

Karl A. Gill; Carlos Simoes Azevedo; Jeremy Batten; Giovanni Cervelli; Robert Grabit; Fredrik B. H. Jensen; Jan Troska; Francois Vasey

doi:10.1117/12.373285

7 December 1999 Accelerated-aging tests of radiation-damaged lasers and photodiodes for the CMS tracker optical links

Karl A. Gill, Carlos Simoes Azevedo, Jeremy Batten, Giovanni Cervelli, Robert Grabit, Fredrik B. H. Jensen, Jan Troska, Francois Vasey

Author Affiliations +

Proceedings Volume 3872, Photonics for Space and Radiation Environments; (1999) https://doi.org/10.1117/12.373285
Event: Remote Sensing, 1999, Florence, Italy

Abstract

The combined effects of radiation damage and accelerated ageing in COTS lasers and p-i-n photodiodes are presented. Large numbers of these devices will be employed in future High Energy Physics experiments and it is vital that these devices are confirmed to be sufficiently robust in terms of both radiation resistance and reliability. Forty 1310 nm InGaAsP edge-emitting lasers (20 irradiated) and 30 InGaAs p-i-n photodiodes (19 irradiated) were aged for 4000 hours at 80 degree(s)C with periodic measurements made of laser threshold and efficiency, in addition to p-i-n leakage current and photocurrent. There were no sudden failures and there was very little wearout-related degradation in either unirradiated or irradiated sample groups. The results suggest that the tested devices have a sufficiently long lifetime to operate for at least 10 years inside the Compact Muon Solenoid experiment despite being exposed to a harsh radiation environment.

Citation Download Citation

Karl A. Gill, Carlos Simoes Azevedo, Jeremy Batten, Giovanni Cervelli, Robert Grabit, Fredrik B. H. Jensen, Jan Troska, and Francois Vasey "Accelerated-aging tests of radiation-damaged lasers and photodiodes for the CMS tracker optical links", Proc. SPIE 3872, Photonics for Space and Radiation Environments, (7 December 1999); https://doi.org/10.1117/12.373285

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available