Optimization of multiple-source illumination for machine vision inspection via visual simulation

Richard M. Wasserman; Andrew D. Silber

doi:10.1117/12.455996

25 October 2002 Optimization of multiple-source illumination for machine vision inspection via visual simulation

Richard M. Wasserman, Andrew D. Silber

Author Affiliations +

Proceedings Volume 4772, Electro-Optical System Design, Simulation, Testing, and Training; (2002) https://doi.org/10.1117/12.455996
Event: International Symposium on Optical Science and Technology, 2002, Seattle, WA, United States

Abstract

Well-adjusted lighting is one of the most important contributors to good quality and robust measurements in video based inspection systems. The optimal selection of lighting varies from part to part, and system to system. System designers must often select from a significant number of competing illumination sources at varied positions in order to determine how best to illuminate a target edge. In cases where an end user must perform the lighting setup this complexity often results in either a poor measurement or a determination that the inspection cannot be performed. This paper describes a general, simulation based methodology to adjust automatically a set of physical illumination sources (both in magnitude and position) so as to achieve a high quality edge measurement. Specific metrics of edge quality and an approach to search the resulting solution space are also presented.

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Richard M. Wasserman and Andrew D. Silber "Optimization of multiple-source illumination for machine vision inspection via visual simulation", Proc. SPIE 4772, Electro-Optical System Design, Simulation, Testing, and Training, (25 October 2002); https://doi.org/10.1117/12.455996

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