Femtosecond x-ray diagnostic

Davide Boschetto; Christian Rischel; Olivier Albert; Jean Etchepare; Ingo Uschmann; S. Fourmaux; Daniele Hulin; Eckhart Forster; Antoine Rousse

doi:10.1117/12.537507

14 November 2003 Femtosecond x-ray diagnostic

Davide Boschetto, Christian Rischel, Olivier Albert, Jean Etchepare, Ingo Uschmann, S. Fourmaux, Daniele Hulin, Eckhart Forster, Antoine Rousse

Author Affiliations +

Proceedings Volume 5147, ALT'02 International Conference on Advanced Laser Technologies; (2003) https://doi.org/10.1117/12.537507
Event: ALT'02 International Conference on Advanced laser Technologies, 2002, Adelboden, Switzerland

Abstract

In this paper we discuss some result achieved at Laboratoire d'Optique Appliquee that may improve the capabilities of the laser-produced plasma x-ray source for applications in the study of ultrafast transient structures.

Citation Download Citation

Davide Boschetto, Christian Rischel, Olivier Albert, Jean Etchepare, Ingo Uschmann, S. Fourmaux, Daniele Hulin, Eckhart Forster, and Antoine Rousse "Femtosecond x-ray diagnostic", Proc. SPIE 5147, ALT'02 International Conference on Advanced Laser Technologies, (14 November 2003); https://doi.org/10.1117/12.537507

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