Paper
8 December 2004 Multi-criteria decision making for disassembly-to-order system under stochastic yields
Author Affiliations +
Proceedings Volume 5583, Environmentally Conscious Manufacturing IV; (2004) https://doi.org/10.1117/12.572060
Event: Optics East, 2004, Philadelphia, Pennsylvania, United States
Abstract
In this paper, we consider the problem of determining the optimal number of returned products to disassemble to fulfill the demand for a specified number of parts. This is known as the disassembly-to-order (DTO) problem. The deterministic yield version of this problem has been addressed in the literature. Recently, the stochastic yield version of this problem with a single objective has also been reported in the literature. In this paper, we extend the methodology to include multiple objectives. To this end, we model the DTO problem using integer goal programming. The stochastic problem is solved by transforming it into its deterministic equivalent problem. This conversion is accomplished by considering the specific structures of the products with one core and one part (“one-to-one structure”) and apply it to handle the products with one core and multiple parts (“one-to-many structure”). For these special cases it is possible to solve the stochastic problem analytically so that valuable insights can be gained by comparing the stochastic and deterministic solutions. This will help us to determine effective deterministic yield equivalents. We present a case example to illustrate the methodology.
© (2004) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Prasit Imtanavanich and Surendra M. Gupta "Multi-criteria decision making for disassembly-to-order system under stochastic yields", Proc. SPIE 5583, Environmentally Conscious Manufacturing IV, (8 December 2004); https://doi.org/10.1117/12.572060
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Cited by 8 scholarly publications.
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KEYWORDS
Stochastic processes

Nondestructive evaluation

Mathematical modeling

Computer programming

Optical proximity correction

Curium

Instrument modeling

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