Six-port reflectometers for terahertz scattering parameter measurements using submillimeter-wavelength detectors

Robert M. Weikle II; Zhiyang Liu; Heng Liu; Lei Liu; Sadik Ulker; Arthur W. Lichtenberger

doi:10.1117/12.571418

19 January 2005 Six-port reflectometers for terahertz scattering parameter measurements using submillimeter-wavelength detectors

Robert M. Weikle II, Zhiyang Liu, Heng Liu, Lei Liu, Sadik Ulker, Arthur W. Lichtenberger

Author Affiliations +

Proceedings Volume 5592, Nanofabrication: Technologies, Devices, and Applications; (2005) https://doi.org/10.1117/12.571418
Event: Optics East, 2004, Philadelphia, Pennsylvania, United States

Abstract

The design, construction, and investigation of a reflectometer for measuring return loss magnitude and phase at submillimeter wavelengths is presented. The instrument, which consists of a section of rectangular waveguide and an ensemble of Schottky diode power detectors is designed as a proof-of-principle demonstration and is a relatively simple implementation of the six-port analyzer originally investigated by Engen and coworkers. Design considerations for the reflectometer are presented and measurements in the 270 GHz to 320 GHz range are discussed.

Citation Download Citation

Robert M. Weikle II, Zhiyang Liu, Heng Liu, Lei Liu, Sadik Ulker, and Arthur W. Lichtenberger "Six-port reflectometers for terahertz scattering parameter measurements using submillimeter-wavelength detectors", Proc. SPIE 5592, Nanofabrication: Technologies, Devices, and Applications, (19 January 2005); https://doi.org/10.1117/12.571418

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