An automatic system for measurement of retardation of wave plates based on phase-shifted method

Zhishan Gao; Ming Yan

doi:10.1117/12.568719

10 February 2005 An automatic system for measurement of retardation of wave plates based on phase-shifted method

Zhishan Gao, Ming Yan

Author Affiliations +

Proceedings Volume 5638, Optical Design and Testing II; (2005) https://doi.org/10.1117/12.568719
Event: Photonics Asia, 2004, Beijing, China

Abstract

A practical system is described to measure the retardation of wave plates with phase-shifted method. The tested wave plate is put in and the original angle between the axis of it and the analyzer is random, not 45 degree. For the measurement is made rapidly and automatically, a standard wave plate act as a compensator, the stepping motor is used to drive the analyzer to realize phase shifting and a grating encoder is used to measure its rotating angle. At the same time, while the beam comes out from the analyzer, the photoelectric detector gets its intensity, and then the signals is magnified, filtered and sent to computer through its serial port. The results show the system has the advantages of costing little time and high accuracy.

Citation Download Citation

Zhishan Gao and Ming Yan "An automatic system for measurement of retardation of wave plates based on phase-shifted method", Proc. SPIE 5638, Optical Design and Testing II, (10 February 2005); https://doi.org/10.1117/12.568719

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