Paper
1 May 1986 Techniques For Suppressing Optical Interference Errors In Infrared Film Thickness Gauging
Roger F. Edgar, Bernard J. Stay
Author Affiliations +
Proceedings Volume 0590, Infrared Technology and Applications; (1986) https://doi.org/10.1117/12.952000
Event: 1985 International Technical Symposium/Europe, 1985, Cannes, France
Abstract
Infrared absorption measurement techniques are widely used in both laboratory and production plant, to measure the thickness and composition of extruded polymer films. Recent developments in film production technology permit the manufacture of transparent films of relatively high refractive index with optically flat and parallel surfaces. Since the optical thickness of such films is comparable with the coherence length of the infrared radiation used, optical interference effects can cause serious errors in the measurement. Various strategies for suppression of interference effects are presented and practical techniques based on these strategies are described.
© (1986) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Roger F. Edgar and Bernard J. Stay "Techniques For Suppressing Optical Interference Errors In Infrared Film Thickness Gauging", Proc. SPIE 0590, Infrared Technology and Applications, (1 May 1986); https://doi.org/10.1117/12.952000
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Cited by 3 scholarly publications.
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KEYWORDS
Absorption

Mirrors

Infrared radiation

Reflection

Sensors

Optics manufacturing

Polymers

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