Paper
7 July 1986 Laser Marking Of Passive Components, Hybrids And Semiconductors
J. F. Higgins
Author Affiliations +
Proceedings Volume 0611, Laser Processing of Semiconductors & Hybrids; (1986) https://doi.org/10.1117/12.956410
Event: O-E/LASE'86 Symposium, 1986, Los Angeles, CA, United States
Abstract
Pulsed CO2 TEA lasers are widely used in the electronics and semiconductor industries to mark passive components, hybrids and semiconductors. In addition to marking simple product identifying codes, an increasing requirement is to have the laser system mark variable information, derived from test results, on these products. This has required the development of laser beam delivery systems of increasing sophistication, capable of marking both alphanumerics and machine readable bar-codes, that are interfaced to test and process control equipment to permit high-speed, variable information coding.
© (1986) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
J. F. Higgins "Laser Marking Of Passive Components, Hybrids And Semiconductors", Proc. SPIE 0611, Laser Processing of Semiconductors & Hybrids, (7 July 1986); https://doi.org/10.1117/12.956410
Lens.org Logo
CITATIONS
Cited by 1 scholarly publication and 2 patents.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Laser marking

Photomasks

Semiconductors

Semiconductor lasers

Beam delivery

Manufacturing

Pulsed laser operation

RELATED CONTENT

Automating the laser diode attach process
Proceedings of SPIE (June 03 2002)
Advanced Q-switched DPSS lasers for ID-card marking
Proceedings of SPIE (February 14 2008)
Markets for marking systems
Proceedings of SPIE (March 01 1991)
Polymer welding with lasers: chances and hurdles
Proceedings of SPIE (February 25 2002)
Laser Redundancy: Past, Present, And Future
Proceedings of SPIE (August 09 1983)

Back to Top