Paper
9 June 2006 Fast qualitative analysis of textile fiber in near infrared spectroscopy based on support vector machine
Donghui Wang, Shangzhong Jin, Bin Gan, Hongnian Feng
Author Affiliations +
Proceedings Volume 6149, 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies; 61493C (2006) https://doi.org/10.1117/12.674348
Event: 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies, 2005, Xian, China
Abstract
The fast qualitative analysis of textile fiber is a crucial step in textile manufacture, export and inspection. This paper presents a near infrared spectroscopy classification method based on SVM for fast qualitative analysis of textile fiber. SVM is a new automatic classification tool and it has successfully been applied to standard classification tasks, such as text classification, pattern identification, bioinformatics and medical diagnosis. In this paper, SVM is extended into near infrared fast qualitative analysis of textile fiber for the first time. In this paper, eight kinds classification algorithms which are composed of two classifiers(C-SVC and ν-SVC) and four kernel functions (linear, polynomial, RBF and sigmoid) are used to do classification experiments and comparison analysis for ten kinds familiar textiles fiber. Experiment results show that it is feasible to apply SVM in fast qualitative analysis of textile fiber, and the optimal classifier algorithm and the corresponding experimental results are reported.
© (2006) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Donghui Wang, Shangzhong Jin, Bin Gan, and Hongnian Feng "Fast qualitative analysis of textile fiber in near infrared spectroscopy based on support vector machine", Proc. SPIE 6149, 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies, 61493C (9 June 2006); https://doi.org/10.1117/12.674348
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KEYWORDS
Near infrared

Inspection

Near infrared spectroscopy

Scalable video coding

Image classification

Statistical analysis

Binary data

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