Automatic differential equation derivation from sampled data for simulation parameter sensitivity analysis

Holger M. Jaenisch

doi:10.1117/12.691253

9 May 2006 Automatic differential equation derivation from sampled data for simulation parameter sensitivity analysis

Holger M. Jaenisch

Author Affiliations +

Proceedings Volume 6229, Intelligent Computing: Theory and Applications IV; 62290N (2006) https://doi.org/10.1117/12.691253
Event: Defense and Security Symposium, 2006, Orlando (Kissimmee), Florida, United States

Abstract

An analytical differential equation model from a single simulation input and output data vector is derived. The derived model is analytically varied (real versus imaginary) to determine Critical, Sensitive, and Key parameters without the use of Design of Experiments (DOE).

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Holger M. Jaenisch "Automatic differential equation derivation from sampled data for simulation parameter sensitivity analysis", Proc. SPIE 6229, Intelligent Computing: Theory and Applications IV, 62290N (9 May 2006); https://doi.org/10.1117/12.691253

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