Paper
20 May 2006 Evaluating films for high transmission attenuated phase shift masks
Author Affiliations +
Abstract
Three types of high transmission attenuated phase shift masks were evaluated. The attenuating materials were obtained from commercial and non-commercial sources. Various key performance metrics were investigated. Blanket film transmission and reflection was measured at various wavelengths. Laser durability and cleaning durability were measured. Standard dry etch processes were used for each film and the profile and surface properties were compared. Final mask transmission and phase were also measured. The summarized results show clear benefits of using some high transmission materials relative to others.
© (2006) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Satoru Nemoto, Toru Komizo, Yasutaka Kikuchi, Emily Gallagher, Jason Benz, Michael Hibbs, and Takashi Haraguchi "Evaluating films for high transmission attenuated phase shift masks", Proc. SPIE 6283, Photomask and Next-Generation Lithography Mask Technology XIII, 628322 (20 May 2006); https://doi.org/10.1117/12.681767
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Etching

Reflection

Quartz

Photomasks

Phase measurement

Phase shifts

Inspection

Back to Top