Using block-based spectral angle measure for iris pattern matching

Yingzi Du; Danny Isklandar

doi:10.1117/12.702640

27 February 2007 Using block-based spectral angle measure for iris pattern matching

Yingzi Du, Danny Isklandar

Author Affiliations +

Proceedings Volume 6497, Image Processing: Algorithms and Systems V; 64970H (2007) https://doi.org/10.1117/12.702640
Event: Electronic Imaging 2007, 2007, San Jose, CA, United States

Abstract

Iris pattern matching is a key step in iris patter recognition system. This paper proposes a new approach for iris pattern matching using block-based spectral angle measure (SAM). The iris patterns in this paper are extracted using Log-Gabor wavelet method. The proposed SAM method will capture not only the phase information, but also the magnitude information. The block based method will enable the flexibility in the pattern matching step, which improves the accuracy and is more tolerable of the pattern dilation/constrain resulted from imperfect preprocessing. The preliminary experimental results show that the proposed method has an encouraging performance.

Citation Download Citation

Yingzi Du and Danny Isklandar "Using block-based spectral angle measure for iris pattern matching", Proc. SPIE 6497, Image Processing: Algorithms and Systems V, 64970H (27 February 2007); https://doi.org/10.1117/12.702640

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