Effective dynamic range measurement for a CCD in full-field industrial x-ray imaging applications

Matteo Bettuzzi; Rosa Brancaccio; Maria Pia Morigi; Franco Casali

doi:10.1117/12.726165

18 June 2007 Effective dynamic range measurement for a CCD in full-field industrial x-ray imaging applications

Matteo Bettuzzi, Rosa Brancaccio, Maria Pia Morigi, Franco Casali

Author Affiliations +

Proceedings Volume 6616, Optical Measurement Systems for Industrial Inspection V; 66161L (2007) https://doi.org/10.1117/12.726165
Event: Optical Metrology, 2007, Munich, Germany

Abstract

CCD cameras are widely used for different applications. Recently they are employed for imaging in industrial X-ray digital radiography or computed tomography inspections. Scientific grade CCD sensors are usually characterized for what concern defects (bad pixels), resolution capability, spectral sensitivity, dark current, pixel full well capacity and so on. In former times CCDs were mostly used in astronomy and dark current was one of the most important parameters to evaluate in this kind of applications because of the long exposure time needed to obtain a good image. Thus, most manufacturers still refer to noise of a CCD as the background (or dark current) noise. This might be in some cases misleading. When one wants to compute the effective dynamic range on the full scale of greylevels, in order to match with the correct number of bit required to quantize the information, and, most of all, to evaluate if the dynamics is adequate, a different analysis of noise is required. It is possible to find an experimental method to measure noise and to derive the effective intrinsic dynamic range of a CCD. A case study, carried out on a commercial CCD camera used in a prototype industrial CT system, is reported in this work and the experimental results are discussed.

Citation Download Citation

Matteo Bettuzzi, Rosa Brancaccio, Maria Pia Morigi, and Franco Casali "Effective dynamic range measurement for a CCD in full-field industrial x-ray imaging applications", Proc. SPIE 6616, Optical Measurement Systems for Industrial Inspection V, 66161L (18 June 2007); https://doi.org/10.1117/12.726165

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

;

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE