Paper
17 September 2007 Measurement of attosecond XUV pulses generated with polarization gating by two-dimensional photoelectron spectroscopy
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Abstract
We report on our high speed camera designed for temporal characterization of attosecond pulses (1as =10-18s) generated with the polarization gating technique. The uniform external magnetic field applied on the time-of-flight spectrometer enlarges the acceptance angle (up to 65° for ~20-eV photoelectrons). By collecting two-dimensional momentum images of the photoelectrons, which are ejected by the XUV pulses and streaked directly by the co-propagating polarization gating electric field, we expect to derive the information about the XUV pulses. After the characterization of XUV pulses, the same setup can be used to study complex dynamics of electrons in atoms and molecules with time-resolved spectroscopy.
© (2007) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Shambhu Ghimire, Ximao Feng, and Zenghu Chang "Measurement of attosecond XUV pulses generated with polarization gating by two-dimensional photoelectron spectroscopy", Proc. SPIE 6703, Ultrafast X-Ray Sources and Detectors, 67030F (17 September 2007); https://doi.org/10.1117/12.737580
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KEYWORDS
Polarization

Extreme ultraviolet

Electrons

Mirrors

Wave plates

Chemical species

Pulsed laser operation

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