Paper
19 August 2010 Merging algorithm of vector graphics primitive based on reliability index for engineering drawings
Bin Cheng, Shusheng Zhang, Yunfei Shi
Author Affiliations +
Proceedings Volume 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering; 78201B (2010) https://doi.org/10.1117/12.866605
Event: International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 2010, Xi'an, China
Abstract
Vectorizing recognition for engineering drawings is currently one of the most active research topics in the domain of pattern recognition. The merging algorithm of vector graphics primitive based on reliability index is presented. According to the dimension of vector basic graphics primitive, the reliability index of vector basic graphics primitive is defined, and then the reliability index of vector graphics primitive is set. Based on the reliability index, the vector graphic primitive is divided into two groups. One is the vector graphics primitive with high reliability index, the other is the vector graphics primitive with low reliability index. Firstly, Taking the graphics primitive with high reliability index as seed graphics primitive to carry out the merging algorithm, when searching the all vector basic graphics primitive is completed, and then the second merging algorithm is produced taking the vector graphics primitive with high reliability index as extending seed until the all vector graphics primitive is searched completely. The algorithm is developed based on the engineering drawing recognition system (EDRS) to merge the basic graphics primitive obtained by EDRS. The algorithm presents good results to merge the vector basic graphics primitive.
© (2010) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Bin Cheng, Shusheng Zhang, and Yunfei Shi "Merging algorithm of vector graphics primitive based on reliability index for engineering drawings", Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 78201B (19 August 2010); https://doi.org/10.1117/12.866605
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KEYWORDS
Visualization

Reliability

Detection and tracking algorithms

Raster graphics

Algorithm development

Pattern recognition

Reconstruction algorithms

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