Design of an IRFPA point-by-point bias calibration

Wei He; Jian Lv; Yun Zhou; Yiying Du; Caideng Yu; Guangzhong Xie; Kai Yuan

doi:10.1117/12.971176

15 October 2012 Design of an IRFPA point-by-point bias calibration

Wei He, Jian Lv, Yun Zhou, Yiying Du, Caideng Yu, Guangzhong Xie, Kai Yuan

Author Affiliations +

Proceedings Volume 8419, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices for Sensing, Imaging, and Solar Energy; 84192A (2012) https://doi.org/10.1117/12.971176
Event: 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies (AOMATT 2012), 2012, Xiamen, China

Abstract

Infrared focal plane array (IRFPA) is a key component in infrared system and thermal imaging devices, widely applied in military and civilian fields, with a huge market potential and prospects. IRFPA readout circuit technology and test technology in its research occupies an important position, related to the ability to accurately and efficiently obtain the IRFPA signal and the ability of IRFPA devices for accurate performance evaluation. This paper uses an IRFPA point-by-point bias calibration, through a series of accurate timing control signals to read and save the calibration data and external input, effectively increases the point-by-point bias control accuracy, and finally improves the quality of the output image.

Citation Download Citation

Wei He, Jian Lv, Yun Zhou, Yiying Du, Caideng Yu, Guangzhong Xie, and Kai Yuan "Design of an IRFPA point-by-point bias calibration", Proc. SPIE 8419, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices for Sensing, Imaging, and Solar Energy, 84192A (15 October 2012); https://doi.org/10.1117/12.971176

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