Paper
17 October 2012 Optical bidirectional force sensor using optical planar waveguide
Myoung Jin Kim, Eun Joo Jung, Sung Hwan Hwang, Woo-Jin Lee, Byung Sup Rho
Author Affiliations +
Proceedings Volume 8421, OFS2012 22nd International Conference on Optical Fiber Sensors; 84213H (2012) https://doi.org/10.1117/12.975670
Event: OFS2012 22nd International Conference on Optical Fiber Sensor, 2012, Beijing, China
Abstract
We demonstrate an optical planar waveguide sensor that can be used to measure the direction and intensity of physical force. The interferometric structure, on which the proposed sensor is based, introduces an interference pattern in wavelength. Its phase is shifted by the external force. On the other hand, since the cross-sectional effective refractive index profile is asymmetric because of the core formed on one side of silica substrate, the phase shift appears with respect to the direction of the external force against the surface. Therefore, we can measure the direction and intensity of the applied force by monitoring the phase change.
© (2012) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Myoung Jin Kim, Eun Joo Jung, Sung Hwan Hwang, Woo-Jin Lee, and Byung Sup Rho "Optical bidirectional force sensor using optical planar waveguide", Proc. SPIE 8421, OFS2012 22nd International Conference on Optical Fiber Sensors, 84213H (17 October 2012); https://doi.org/10.1117/12.975670
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KEYWORDS
Sensors

Waveguides

Planar waveguides

Phase shifts

Refractive index

Silica

Interferometry

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