Near infrared non-destructive inspection of inner qualities by multivariate analysis

Chih-Wen Chen; Yih-Shing Lee; Shang-Ping Ying; Chien-Kuo Ku; Ming-Ying Hsu

doi:10.1117/12.2018603

22 June 2013 Near infrared non-destructive inspection of inner qualities by multivariate analysis

Chih-Wen Chen, Yih-Shing Lee, Shang-Ping Ying, Chien-Kuo Ku, Ming-Ying Hsu

Author Affiliations +

Proceedings Volume 8769, International Conference on Optics in Precision Engineering and Nanotechnology (icOPEN2013); 87692P (2013) https://doi.org/10.1117/12.2018603
Event: International Conference on Optics in Precision Engineering and Nanotechnology (icOPEN2013), 2013, Singapore, Singapore

Abstract

In this study, multivariate data analysis, especially partial least squares regression (PLSR), is applied to analyze the near infrared absorbance spectra of fruit samples in order to acquire the inner qualities without destroying the samples. The calibration models have been established for the samples with raw data, first order derivative and second order derivative treatments, respectively. In the meantime, the models have been verified by using cross validation method. As anticipated, a model with higher correlation coefficient (r) and lower root mean square error of calibration (RMSEC) is preferred for both calibration and cross validation. The results reveal that the calibration models with second order derivative treatments have higher correlation coefficient, coefficient of determination, as well as lower RMSEC. Furthermore, the calibration models have been optimized by selecting partial wavelengths as new variables based on absorbance spectra and regression coefficient. The reasons why the calibration models are improved might be suitably cutting off partial wavelengths causing noises in the model.

Citation Download Citation

Chih-Wen Chen, Yih-Shing Lee, Shang-Ping Ying, Chien-Kuo Ku, and Ming-Ying Hsu "Near infrared non-destructive inspection of inner qualities by multivariate analysis", Proc. SPIE 8769, International Conference on Optics in Precision Engineering and Nanotechnology (icOPEN2013), 87692P (22 June 2013); https://doi.org/10.1117/12.2018603

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

;

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE