Paper
24 June 2014 Cooled and uncooled infrared detectors for missile seekers
Author Affiliations +
Abstract
Electro-optical missile seekers pose exceptional requirements for infrared (IR) detectors. These requirements include: very short mission readiness (time-to-image), one-time and relatively short mission duration, extreme ambient conditions, high sensitivity, fast frame rate, and in some cases small size and cost. SCD is engaged in the development and production of IR detectors for missile seeker applications for many years. 0D, 1D and 2D InSb focal plane arrays (FPAs) are packaged in specially designed fast cool-down Dewars and integrated with Joule-Thomson (JT) coolers. These cooled MWIR detectors were integrated in numerous seekers of various missile types, for short and long range applications, and are combat proven. New technologies for the MWIR, such as epi-InSb and XBn-InAsSb, enable faster cool-down time and higher sensitivity for the next generation seekers. The uncooled micro-bolometer technology for IR detectors has advanced significantly over the last decade, and high resolution - high sensitivity FPAs are now available for different applications. Their much smaller size and cost with regard to the cooled detectors makes these uncooled LWIR detectors natural candidates for short and mid-range missile seekers. In this work we will present SCD's cooled and uncooled solutions for advanced electro-optical missile seekers.
© (2014) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Rami Fraenkel, Jacob Haski, Udi Mizrahi, Lior Shkedy, Itay Shtrichman, and Ephi Pinsky "Cooled and uncooled infrared detectors for missile seekers", Proc. SPIE 9070, Infrared Technology and Applications XL, 90700P (24 June 2014); https://doi.org/10.1117/12.2050099
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CITATIONS
Cited by 6 scholarly publications.
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KEYWORDS
Sensors

Missiles

Staring arrays

Infrared detectors

Single crystal X-ray diffraction

Nonuniformity corrections

Temperature metrology

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