A no-reference contourlet-decomposition-based image quality assessment method for super-resolution recontruction

Wei Zhang; Zhongcheng Fan

doi:10.1117/12.2074661

5 November 2014 A no-reference contourlet-decomposition-based image quality assessment method for super-resolution reconstruction

Wei Zhang, Zhongcheng Fan

Author Affiliations +

Proceedings Volume 9273, Optoelectronic Imaging and Multimedia Technology III; 927326 (2014) https://doi.org/10.1117/12.2074661
Event: SPIE/COS Photonics Asia, 2014, Beijing, China

Abstract

A no-reference image quality assessment method for super-resolution reconstruction is proposed. The basic idea is to perform a contourlet multiscale decomposition of low resolution image and reconstructed super resolution image first. According to the relativity of the contourlet coefficient, the reconstructed image is divided into sharp edges, image texture and flat region. Then, calculate the ringing intensity index of sharp edges, the blur extent index of the image texture and the directional entropy index of the high frequency components. Finally, the result to evaluate the reconstructed image quality is obtained by integrated these indexes into one total image quality index. Several experimental results using simulated images demonstrate the new index is efficient and stable for evaluating the quality of the reconstructed super-resolution image. It performs well in accordance with human subjective vision.

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Wei Zhang and Zhongcheng Fan "A no-reference contourlet-decomposition-based image quality assessment method for super-resolution reconstruction", Proc. SPIE 9273, Optoelectronic Imaging and Multimedia Technology III, 927326 (5 November 2014); https://doi.org/10.1117/12.2074661

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