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Structured Illumination Microscopy (SIM) is a widely used super-resolution microscopy method, capable of imaging at twice the diffraction limit of conventional widefield microscopes. We developed a new method to assess in silico the spatio-temporal resolution limits of SIM, and demonstrated that its capacity to reconstruct super-resolved information is substantially worse than the time required to acquire a full stack of raw frames. We also applied our method to gauge the efficacy of a reconstruction method termed “rolling SIM” which claimed to improve the temporal resolution of SIM, and we showed that this is not the case.
Abderrahim Boualam andChristopher J. Rowlands
"Can we see both small and fast? Investigating the speed limits of Structured Illumination Microscopy (SIM)", Proc. SPIE PC11967, Single Molecule Spectroscopy and Superresolution Imaging XV, PC119670F (2 March 2022); https://doi.org/10.1117/12.2604972
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Abderrahim Boualam, Christopher J. Rowlands, "Can we see both small and fast? Investigating the speed limits of Structured Illumination Microscopy (SIM)," Proc. SPIE PC11967, Single Molecule Spectroscopy and Superresolution Imaging XV, PC119670F (2 March 2022); https://doi.org/10.1117/12.2604972