Massively parallel optical/electrical embedded test for microLED wafer/matrix mass production: redefining the technology game

Kotaro Hasegawa; Ira Leventhal

doi:10.1117/12.2608406

7 March 2022 Massively parallel optical/electrical embedded test for microLED wafer/matrix mass production: redefining the technology game

Kotaro Hasegawa, Ira Leventhal

Author Affiliations +

Proceedings Volume PC12022, Light-Emitting Devices, Materials, and Applications XXVI; PC120220V (2022) https://doi.org/10.1117/12.2608406
Event: SPIE OPTO, 2022, San Francisco, California, United States

Conference Poster

Abstract

Micro-LED has excellent technical advantage, and the manufacturing cost is getting reduced. To be mainstream technology, the next bottle neck is the testing cost. The existing test approach has issue of performance, accuracy and throughput then it is impacting entire manufacturing cost. One of issue on test is the EL optical test performance and throughput which test LED one by one. There is strong demand want to the optical test die in parallel but should meet mass production performance. This presentation offers brand new approach of the micro-LED wafer testing especially for upcoming Mass Production. Which has electrical/optical test embedded as single setup, massive parallel test of electrical/optical test with excellent throughput. Also this approach could use for matrix/unit testing.

Citation Download Citation

Kotaro Hasegawa and Ira Leventhal "Massively parallel optical/electrical embedded test for microLED wafer/matrix mass production: redefining the technology game", Proc. SPIE PC12022, Light-Emitting Devices, Materials, and Applications XXVI, PC120220V (7 March 2022); https://doi.org/10.1117/12.2608406

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