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15 June 2023 Ultra-thin flat lens for sub-diffraction limit focusing and imaging
Jinghua Teng, Zeng Wang, Steve Wu, Ahmed Elbanna, Mengting Jiang, Arash Nemati
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Proceedings Volume PC12514, Image Sensing Technologies: Materials, Devices, Systems, and Applications X; PC125140B (2023) https://doi.org/10.1117/12.2660706
Event: SPIE Defense + Commercial Sensing, 2023, Orlando, Florida, United States
Abstract
Flat optics with micro-nano-structures fabricated on a thin film has shown strong power in light manipulation and is promising for integrated optoelectronics for its compactness and compatibility for large volume manufacturing. In this talk, I will introduce flat lenses to break the diffraction limit and their applications in medical imaging and high density data storage. By engaging the strong excitonic absorption in 2D materials, ultra-thin flat lenses in MoS2 is demonstrated for sub-diffraction limit imaging. Furthermore, high electrical tunability in refractive index is achieved in monolayer WS2 in an optical cavity for potentially tunable ultra-thin flat lenses.
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Jinghua Teng, Zeng Wang, Steve Wu, Ahmed Elbanna, Mengting Jiang, and Arash Nemati "Ultra-thin flat lens for sub-diffraction limit focusing and imaging", Proc. SPIE PC12514, Image Sensing Technologies: Materials, Devices, Systems, and Applications X, PC125140B (15 June 2023); https://doi.org/10.1117/12.2660706
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KEYWORDS
Optics manufacturing
Resonance enhancement
Optical resonators
Optoelectronics
Reflectivity
Refractive index
Silicon
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