Large-area detector performance for hard X-ray solution scattering at the LCLS (Conference Presentation)

Tim B. van Driel

doi:10.1117/12.2669195

9 June 2023 Large-area detector performance for hard X-ray solution scattering at the LCLS (Conference Presentation)

Tim B. van Driel

Proceedings Volume PC12581, X-Ray Free-Electron Lasers: Advances in Source Development and Instrumentation VI; PC125810D (2023) https://doi.org/10.1117/12.2669195
Event: SPIE Optics + Optoelectronics, 2023, Prague, Czech Republic

Abstract

Large area detectors with high dynamic range, low noise and fast pulse-to-pulse readout have been developed to accommodate the unique requirements and pulse structure of XFEL facilities. In the case of hard x-ray solution scattering the detectors need to capture intense diffuse scattering patterns covering a large area and dynamic range. Furthermore, time-resolved solution scattering needs the performance, stability, linearity and noise profile to extract percent to permille level changes in such scattering patterns reliably. The ePix10k2M (2019) is the second hard x-ray large area detector developed for the LCLS, it offers a number of advantages over the previous CSPAD detector. The ePix10k2M has 3 different fixed gain-modes as well as two auto-ranging/auto-switching modes. The combination of gains allows for the coverage of a large hard x-ray dynamic range from single photon counting to ~10k photons/pixel/pulse. Here, the performance is evaluated for the detection of hard x-ray solution scattering and compares the different configurations in which it can be run. Finally, some perspectives are presented on the future use and development of such detectors at the higher energies and higher repetition rates that are becoming available.

Conference Presentation

Citation Download Citation

Tim B. van Driel "Large-area detector performance for hard X-ray solution scattering at the LCLS (Conference Presentation)", Proc. SPIE PC12581, X-Ray Free-Electron Lasers: Advances in Source Development and Instrumentation VI, PC125810D (9 June 2023); https://doi.org/10.1117/12.2669195

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KEYWORDS

Liquid crystal lasers

Scattering

Hard x-rays

Reflection

Tunable filters

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