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10 August 2023 The analysis of XRF images using discrete wavelet transformation with application to artworks
Jake Hollis, Golnaz Shahtahmassebi, Haida Liang
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Proceedings Volume PC12620, Optics for Arts, Architecture, and Archaeology (O3A) IX; PC1262005 (2023) https://doi.org/10.1117/12.2675034
Event: SPIE Optical Metrology, 2023, Munich, Germany
Abstract
X-ray Fluorescence images often contain many spectral layers, which can result in long computation times when performing analysis. In this talk, discrete wavelet transformation is used in order to reduce the spectral layers, whilst maintaining the image information so that analysis may be performed at a reduced runtime. Furthermore, once the analysis of the transformed image has been complete, the inverse discrete wavelet transformation is then used to return the image cube back to its original dimensions. The proposed method is effective for cultural heritage as the elemental analysis gathered from XRF images is now obtained in a timely manner.
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Jake Hollis, Golnaz Shahtahmassebi, and Haida Liang "The analysis of XRF images using discrete wavelet transformation with application to artworks", Proc. SPIE PC12620, Optics for Arts, Architecture, and Archaeology (O3A) IX, PC1262005 (10 August 2023); https://doi.org/10.1117/12.2675034
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KEYWORDS
Image analysis
Wavelets
Linear filtering
Fluorescence imaging
Wavelet transforms
Computation time
Cultural heritage
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