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Near field scanning optical microscopy (NSOM) has evolved into a rich field of study with many different variants over the past 25 years. In this talk we review recent results from an entirely new modality of microscopy where optical imaging is performed by measuring the dipole-dipole interaction force (or the trapping force) between an optically driven sample and its mirror image in the tip. Photo induced force microscopy is capable of measuring both the linear and non-linear optical response of a sample on the nanoscale. We shall review recent data both in the visible and in the mid infrared range of the spectrum.
H. K. Wickramasinghe
"Evolution of nanoscale optical spectroscopy from NSOM to photo induced force microcopy", Proc. SPIE PC12654, Enhanced Spectroscopies and Nanoimaging 2023, PC126540F (5 October 2023); https://doi.org/10.1117/12.2678813
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H. K. Wickramasinghe, "Evolution of nanoscale optical spectroscopy from NSOM to photo induced force microcopy," Proc. SPIE PC12654, Enhanced Spectroscopies and Nanoimaging 2023, PC126540F (5 October 2023); https://doi.org/10.1117/12.2678813