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Our study introduces a new method for label-free super-resolved polarimetry on nanomaterials, compatible with in-situ analysis. Integrating Image Scanning Microscopy (ISM) with polarimetry techniques, we achieve remarkable resolutions down to 90 nm while acquiring polarization information. Overcoming limitations associated with fluorophores in challenging materials, our approach facilitates quantitative measurements of optical properties. Applied successfully to nanostructured surfaces created by femtosecond lasers and boron nitride nanotubes, our work showcases the versatility of this methodology.
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Jose-Alberto Aguilar Mora, Duc-Minh Ta, Jean-Baptiste Marceau, Javier Prada Rodrigo, Sedao XXX, Etienne Gaufrès, Cyril Mauclair, Pierre Bon, "Label-free super-resolved polarimetry on nanomaterials," Proc. SPIE PC13005, Laser + Photonics for Advanced Manufacturing , PC1300511 (20 June 2024); https://doi.org/10.1117/12.3024419