1 March 1987 Current Readout Of Infrared Detectors
Nathan Bluzer, Arthur S. Jensen
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Abstract
A buffered direct-injection (BDI) current readout for infrared detectors is described and analyzed. It is compared with the common direct-injection (DI) circuit with respect to injection efficiency, noise, and tolerance of low RoA product photovoltaic detectors. Power requirements and threshold control are also discussed. Throughout the analysis it is clear that much advantage is gained at relatively little cost by the use of a BDI structure for an integrated circuit focal plane.
Nathan Bluzer and Arthur S. Jensen "Current Readout Of Infrared Detectors," Optical Engineering 26(3), 263241 (1 March 1987). https://doi.org/10.1117/12.7974057
Published: 1 March 1987
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CITATIONS
Cited by 34 scholarly publications and 6 patents.
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KEYWORDS
Infrared detectors

Integrated circuits

Photovoltaic detectors

Tolerancing

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