Phase unwrapping algorithm based on reliability and edge detection

Jie-Lin Li; Xianyu Su; Ji-Tao Li

doi:10.1117/1.601194

1 June 1997 Phase unwrapping algorithm based on reliability and edge detection

Jie-Lin Li, Xianyu Su, Ji-Tao Li

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Optical Engineering, Vol. 36, Issue 6, (June 1997). https://doi.org/10.1117/1.601194

A new phase unwrapping algorithm based on reliability and edge detection is presented. Since the edge is detected efficiently through edge relaxation, the unwrapping procedure is simplified within the areas embraced by edges. Penetrating edges according to reliability ensures that this method will limit the unwrapping error to local-minimum areas at worst.

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Jie-Lin Li, Xianyu Su, and Ji-Tao Li "Phase unwrapping algorithm based on reliability and edge detection," Optical Engineering 36(6), (1 June 1997). https://doi.org/10.1117/1.601194

Published: 1 June 1997

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