Electromagnetic analysis of finite thickness diffractive elements

Dennis W. Prather; Shouyuan Shi; Jay Sonstroem

doi:10.1117/1.1487856

1 August 2002 Electromagnetic analysis of finite thickness diffractive elements

Dennis W. Prather, Shouyuan Shi, Jay Sonstroem

Optical Engineering, Vol. 41, Issue 8, (August 2002). https://doi.org/10.1117/1.1487856

We present an electromagnetic analysis of diffractive optical elements (DOEs) fabricated on finite-thickness substrates. To this end we use the finite-difference time-domain (FDTD) method to solve the electromagnetic boundary value problem in the vicinity of the DOE and a semi-infinite propagation algorithm to determine the diffracted fields on the output side of the substrate. The formulation of the method and its application to the analysis of several finite-thickness diffractive lenses is presented.

©(2002) Society of Photo-Optical Instrumentation Engineers (SPIE)

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Dennis W. Prather, Shouyuan Shi, and Jay Sonstroem "Electromagnetic analysis of finite thickness diffractive elements," Optical Engineering 41(8), (1 August 2002). https://doi.org/10.1117/1.1487856

Published: 1 August 2002

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